This procedure is based on Inductively Coupled Plasma Mass Spectrometry (ICP-MS) which is applicable to determine metal contaminants in plantation white sugar.
This method is applicable to plantation white sugar for the analysis of contaminants as arsenic, cadmium, chromium, copper, mercury, lead and tin up to 200 μg/kg with a lower limit of quantification (LOQ) of 10 μg/kg.
In a single laboratory validation, for a testing range of (10 to 200) μg/kg for each metal, intra laboratory average repeatability values for selected elements were determined as below:
|Relative repeatability %
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Please click here to open ICUMSA Method GS9-1 (2019).